Class Balanced Sampling for the Training in GANs

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*All presentations are available in the virtual platform on-demand. The posters will also be exhibited onsite in Hall E, Tokyo International Forum from 15 – 17 December 2021.

Abstract: We propose class standardized critic score based sample selection which enables class balanced sample selection. Our method achieves improved FID score and Intra-FID score compared to prior Top-k selection.

Author(s)/Presenter(s):
Sanghun Kim, KHU, South Korea
Seungkyu Lee, KHU, South Korea

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